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DFT isn’t Just About Coverage – It’s About Closure Speed
In today's fast-paced technology landscape, companies are constantly seeking ways to improve the reliability and efficiency of their...
4 min read
Reusability in ATPG: The Hidden Goldmine
In the fast-paced world of automated test pattern generation (ATPG), many teams often overlook the power of reusability. Yet, it is a...
4 min read
Scan Compression for 5nm Nodes – What Changes?
As the semiconductor industry pushes the limits of miniaturization, the shift to 5nm node technology presents both exciting opportunities...
4 min read
Memory BIST Repair IPs – Are You Using Them Right?
In today's fast-paced world of electronic design automation (EDA), memory BIST (Built-In Self-Test) repair IPs (Intellectual Property)...
4 min read
Debug-Ready from Day 0: Why DFD Needs Early Planning
In today's fast-paced software environment, robust debugging processes are essential for success. Launching a product without...
3 min read
DeFT Semiconductors Joins Forces with Leading Fabless Companies
The semiconductor industry is undergoing a massive transformation. With Moore's Law slowing, design complexity exploding, and...
5 min read
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